Latest News

We are extending our terahertz expertise to the mid-infrared range. Together with the Fraunhofer IOF, we are investigating non-linear crystals for the optical frequency conversion of ultrashort laser pulses from the near to the mid-infrared range. The Fraunhofer Cluster of Excellence Advanced Photon Sources CAPS is funding the project with a total of 250,000 euros. 

Battery simulation has been a focus of research at our institute for many years. Quality control has recently been added to this area of research. The focus here is on electrodes and their conductive properties. At the leading trade fair »Battery Show Europe« in Stuttgart, experts will be presenting these innovations in Hall 9 at Booth B85.

The PANNDT conference offers a platform for experts and researchers to exchange information on NDT techniques (non-destructive testing techniques). Our expert Dr. Joachim Jonuscheit, deputy head of the »Materials Characterization and Testing« department, presents an exhibit entitled »Inline Thickness Measurement of Coatings on Battery Foils« at the joint booth with Fraunhofer FHR.

The conference focuses on advances in mid-infrared optoelectronics and provides a platform for researchers to discuss applications in the mid-infrared spectrum. Prof. Dr. Ioachim Pupeza from the »Materials Characterization and Testing« department gives a plenary lecture entitled »High-Sensitivity and High-Dynamic-Range Field-Resolved Infrared Spectroscopy for Biology and Medicine«.

Control is a conference and fair for industrial quality assurance. Our experts from the »Materials Characterization and Testing« and »Image Processing« departments are on site to present the main topics of »Inline Surface Inspection Systems and Virtual Inspection Planning« and »Non-destructive and Non-Contact Layer Thickness Measurement«.

The conference of the German Society for Non-Destructive Testing offers a platform for the exchange of specialist knowledge and current developments in the field of NDT. Our expert Dr. Joachim Jonuscheit, deputy head of the department »Material Characterization and Testing«, gives a presentation on »Possibilities of Industrial Use of Microwave and Terahertz Testing Technology«.