The microstructure of modern materials largely determines their macroscopic material properties. We develop algorithms for the characterization and stochastic modeling of such microstructures on the basis of image data.
Since 2000, algorithms have been developed at the Fraunhofer ITWM for the analysis of three-dimensional image data. In particular, the in-house computed tomography scanner provides high-resolution tomographies of material structures.
We use the results of the image analysis to geometrically model the observed structures. In doing so, we use stochastic models that represent microscopic variability in a natural way. These models enable microstructure optimization and virtual material design.